IJPAM: Volume 31, No. 1 (2006)




Temple University
638 Wachman Hall, 1805 N. Broad Street, Philadelphia, PA 19122, USA
e-mail: yang@temple.edu

Department of Statistics and Probability
Michigan State University
East Lansing, MI 48825-1107, USA
e-mail: zeleke@msu.edu
Abstract.Let be a simple random walk (SRW) defined on
. We
construct a stochastic process from
by erasing loops of
length at most
, where
and
is the scaling parameter that will be taken to infinity in
determining the limiting distribution. We call this process the
loop erased walk (
LEW). Under some
assumptions we will prove that for
, the limiting distribution is Gaussian. Here
is the intersection exponent of random walks in
For
the limiting distribution is equal to the
limiting distribution of the loop erased walk (
).
It is known that
. We conjecture that for
, the limiting distribution of
LEW is
Gaussian and hence the critical value is
. Our
result implies that the complexity of simulating an
-step loop
erased walk on
has a deterministic uniform upper bound
and lower bound
.
Received: July 5, 2006
AMS Subject Classification: 60G50, 82B41
Key Words and Phrases: loop erased walk, intersection of random walks, complexity of self-avoiding paths
Source: International Journal of Pure and Applied Mathematics
ISSN: 1311-8080
Year: 2006
Volume: 31
Issue: 1